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Title

Long-Term Stability of Process Scores in the French WISC-IV

Authors
Rossier, Jérôme
Presented at The 19th Meeting of the European Society for Cognitive Psychology (ESCOP). Paphos (Cyprus) - 17th to 20th September 2015 - . 2015
Abstract In order to provide clinicians with a more thorough understanding of child’s performance on Block Design, Digit Span and Cancellation, seven process scores are included in the Wechsler Intelligence Scale for Children-Four edition (WISC-IV): Block Design No Time Bonus (BDN), Digit Span Forward (DSF), Digit Span Backward (DSB), Longest Digit Span Forward (LDSF), and Longest Digit Span Backward (LDSB). For relevance of prognostic statements, it is essential to rely on test scores that are stable across time. The goal of this study was to explore the long-term stability of the WISC-IV process scores (BDN, DSF, DSB, LDSF, and LDSB). The sample consisted of 277 nonclinical French-speaking Swiss children aged between 7 and 12 years (at first testing: mean age = 8.87 and SD = 0.82; at second testing: mean age=10.64 and SD = 1.11). The WISC-IV were administered twice in an average test-retest interval of 1.77 years (SD = 0.56).
Keywords WISC-IVLong-term stabilityTest-retestProcess scores
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Structures
Research groups Evaluation psychométrique et différences individuelles (EPEDI)
Unité de psychologie clinique des relations interpersonnelles (UPCRI)
Project FNS: 135406
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(ISO format)
KIENG, Sotta et al. Long-Term Stability of Process Scores in the French WISC-IV. In: The 19th Meeting of the European Society for Cognitive Psychology (ESCOP). Paphos (Cyprus). 2015. https://archive-ouverte.unige.ch/unige:76718

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Deposited on : 2015-10-30

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