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Long-Term Stability of Process Scores in the French WISC-IV

Presented atThe 19th Meeting of the European Society for Cognitive Psychology (ESCOP), Paphos (Cyprus), 17th to 20th September 2015
Publication date2015
Abstract

In order to provide clinicians with a more thorough understanding of child's performance on Block Design, Digit Span and Cancellation, seven process scores are included in the Wechsler Intelligence Scale for Children-Four edition (WISC-IV): Block Design No Time Bonus (BDN), Digit Span Forward (DSF), Digit Span Backward (DSB), Longest Digit Span Forward (LDSF), and Longest Digit Span Backward (LDSB). For relevance of prognostic statements, it is essential to rely on test scores that are stable across time. The goal of this study was to explore the long-term stability of the WISC-IV process scores (BDN, DSF, DSB, LDSF, and LDSB). The sample consisted of 277 nonclinical French-speaking Swiss children aged between 7 and 12 years (at first testing: mean age = 8.87 and SD = 0.82; at second testing: mean age=10.64 and SD = 1.11). The WISC-IV were administered twice in an average test-retest interval of 1.77 years (SD = 0.56).

Keywords
  • WISC-IV
  • Long-term stability
  • Test-retest
  • Process scores
Funding
  • Swiss National Science Foundation - 135406
Citation (ISO format)
KIENG, Sotta et al. Long-Term Stability of Process Scores in the French WISC-IV. In: The 19th Meeting of the European Society for Cognitive Psychology (ESCOP). Paphos (Cyprus). 2015.
Main files (1)
Poster
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Identifiers
  • PID : unige:76718
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Technical informations

Creation25/09/2015 09:49:00
First validation25/09/2015 09:49:00
Update14/03/2023 23:46:32
Status update14/03/2023 23:46:32
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