| The role of Sn addition on the improvement of Jc in PbMo6S8 | IEEE Transactions on Applied Superconductivity |  | | 1993 | 397 | 0 |
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| Hot-carrier scattering in a metal: a ballistic-electron-emission microscopy investigation on PtSi | Physical Review. B, Condensed Matter |  | | 1993 | 403 | 445 |
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| Ballistic electron emission microscopy of Schottky diodes on RF-plasma-treated silicon | Applied Surface Science | | | 1993 | 371 | 0 |
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| Superconducting, microstructural, and grain boundary properties of hot‐pressed PbMo6S8 | Journal of Applied Physics | | | 1992 | 426 | 430 |
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| Scanning tunneling spectroscopy of the Abrikosov flux lattice from the clean toward the dirty limit | Ultramicroscopy | | | 1992 | 520 | 0 |
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| A low-temperature scanning tunneling microscope with in-situ sample cleaving | Ultramicroscopy | | | 1992 | 433 | 0 |
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| Ballistic electron emission microscopy study of PtSi–n-Si(100) Schottky diodes | Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures Processing, Measurement and Phenomena | | | 1992 | 386 | 432 |
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| Studies of the surface structure of YBa2Cu3O7 thin films using STM | Ultramicroscopy | | | 1992 | 559 | 0 |
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| Scanning tunneling spectroscopy of a vortex core from the clean to the dirty limit | Physical Review Letters | | | 1991 | 304 | 758 |
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| A vertical piezoelectric inertial slider | Review of Scientific Instruments | | | 1990 | 273 | 268 |
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| Study of field‐emitting microstructures using a scanning tunneling microscope | Journal of Vacuum Science & Technology. A: Vacuum, Surfaces, and Films | | | 1990 | 237 | 0 |
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| Properties of homogeneous Y1-xPrxBa2Cu3O7 alloy thin films prepared using layer by layer growth | Physica B: Condensed Matter | | | 1990 | 255 | 0 |
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| A versatile low‐temperature scanning tunneling microscope | Journal of Vacuum Science & Technology. A: Vacuum, Surfaces, and Films | | | 1990 | 257 | 0 |
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| Direct measurements of the local electron transport properties in YBaCuO superconducting thin films | Physica C: Superconductivity and Its Applications | | | 1989 | 267 | 0 |
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| Enhanced field-emission investigation of aluminum | IEEE Transactions on Electrical Insulation | | | 1989 | 233 | 0 |
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| Investigation of field emitting microstructures by scanning electron and scanning tunnelling microscopy | Proceedings of the International Conference on Vacuum Microelectronics (2nd) | | | 1989 | 231 | 110 |
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