Scientific article
English

Enhanced field-emission investigation of aluminum

Published inIEEE Transactions on Electrical Insulation, vol. 24, no. 6, p. 911-916
Publication date1989
Abstract

Enhanced field emission on high-purity aluminum has been investigated. The current/voltage characteristic (Fowler-Nordheim plot), the chemical composition as determined by Auger electron spectroscopy and X-ray microprobe analysis, and the topography of field-emitting sites were studied locally. In addition, results on the evolution of these sites under heat treatment, Ar/sup +/ sputtering, and exposure to atmosphere are presented. The field-emitting sites on aluminum are all related to particles approximately 30 mu m in size standing on the surface. The average emission over 1-cm/sup 2/ areas is little affected by the abovementioned surface treatments.

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Citation (ISO format)
RENNER, Christoph, NIEDERMANN, Philipp, FISCHER, Oystein. Enhanced field-emission investigation of aluminum. In: IEEE Transactions on Electrical Insulation, 1989, vol. 24, n° 6, p. 911–916.
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Article (Published version)
accessLevelRestricted
Identifiers
  • PID : unige:151222
Additional URL for this publicationhttps://ieeexplore.ieee.org/document/46310
Journal ISSN0018-9367
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