Investigation of field emitting microstructures by scanning electron and scanning tunnelling microscopy
ContributorsNiedermann, Philipp; Renner, Christoph ; Kent, Andrew; Fischer, Oystein
Published inProceedings of the International Conference on Vacuum Microelectronics (2nd), p. 173-176
Presented at Bath, 24-26 July 1989
Publication date1989
Abstract
Research group
Citation (ISO format)
NIEDERMANN, Philipp et al. Investigation of field emitting microstructures by scanning electron and scanning tunnelling microscopy. In: Proceedings of the International Conference on Vacuum Microelectronics (2nd). Bath. [s.l.] : [s.n.], 1989. p. 173–176.
Main files (1)
Proceedings chapter (Published version)
Identifiers
- PID : unige:151249