Proceedings chapter

English

Investigation of field emitting microstructures by scanning electron and scanning tunnelling microscopy

ContributorsNiedermann, Philipp; Renner, Christoph

; Kent, Andrew; Fischer, Oystein

Presented atBath, 24-26 July 1989

Published inProceedings of the International Conference on Vacuum Microelectronics (2nd), p. 173-176

Publication date1989

Abstract

A study of enhanced field emission on broad area niobium cathodes is presented. Emitting sites have been investigated by field emission scans, scanning electron microscopy and scanning tunneling microscopy. All except one of 14 studied emitters are of micron or submicron size. A trend is observed for the emitting structures to be smaller than predicted from the protrusion model as is also demonstrated with the aid of a specific example of a field emitting site.

Affiliation entities

Faculté des sciences / Section de physique / Département de physique de la matière quantique

Research groups

Groupe Renner

Citation (ISO format)

NIEDERMANN, Philipp et al. Investigation of field emitting microstructures by scanning electron and scanning tunnelling microscopy. In: Proceedings of the International Conference on Vacuum Microelectronics (2nd). Bath. [s.l.] : [s.n.], 1989. p. 173–176.

Proceedings chapter (Published version)

Identifiers

PID : unige:151249

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