We present a stochastic path integral method to calculate the full-counting statistics of conductors with energy conserving dephasing probes and dissipative voltage probes. The approach is explained for the experimentally important case of a Mach-Zehnder interferometer, but is easily generalized to more complicated setups. For all geometries where dephasing may be modeled by a single one-channel dephasing probe we prove that our method yields the same full-counting statistics as phase averaging of the cumulant generating function.