Piezoelectric response of epitaxial Pb(Zr0.2Ti0.8)O3 films measured by scanning tunneling microscopy
Published inApplied physics letters, vol. 77, no. 11, 1701
Publication date2000
Abstract
Keywords
- Ferroelectric thin films
- Thin films
- Electric measurements
- Epitaxy
- Metallic thin films
Affiliation entities
Research groups
Citation (ISO format)
KUFFER, Olivier et al. Piezoelectric response of epitaxial Pb(Zr0.2Ti0.8)O3 films measured by scanning tunneling microscopy. In: Applied physics letters, 2000, vol. 77, n° 11, p. 1701. doi: 10.1063/1.1309017
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Article (Published version)
Identifiers
- PID : unige:35911
- DOI : 10.1063/1.1309017
Additional URL for this publicationhttp://scitation.aip.org/content/aip/journal/apl/77/11/10.1063/1.1309017
Journal ISSN0003-6951