The stabilizing role of permanent iridium modifier deposited on tungsten-treated (WTP) and zirconium-treated (ZrTP) platforms of transversely heated graphite atomizer (THGA) was studied in detail by electrothermal atomic absorption spectrometry (ETAAS) and different surface techniques in model experiments for Ag, Bi and Te. The comparison of the stabilizing efficiency of permanent Ir modifier on WTP and ZrTP and each of the single components, reveals the better effect of Ir on WTP and Ir itself. The extent of analyte losses during pre-atomization and the strength of analyte association with the modifier were estimated by the plotting of 'differential vaporization curves'. The existence of double peaks of Ag, Bi and Te in WTP and Ir on WTP was confirmed and possible reasons for their formation were discussed. The absorbance profiles presented as differential curves reveal an existence of at least two different types of precursors determining processes of atom generation. The observed differences in the behavior of Ir permanent modifier on WTP and ZrTP, respectively, were explained by the different extent of iridium-tungsten and iridium-zirconium interaction and surface distribution. XRF, ESCA and SEM studies reveal non-uniform distribution of the modifier on the graphite substrate and the presence of oxide containing species on the surface. (C) 1999 Elsevier Science B.V. All rights reserved.