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Structural analysis of LaVO3 thin films under epitaxial strain

Karandeep, x
Oberson, L.
Alexander, D. T. L.
Ghosez, Ph.
Published in APL Materials. 2018, vol. 6, no. 4, p. 046102
Abstract Rare earth vanadate perovskites exhibit a phase diagram in which two different types of structural distortions coexist: the strongest, the rotation of the oxygen octahedra, comes from the small tolerance factor of the perovskite cell (t = 0.88 forLaVO3) and the smaller one comes from inter-site d-orbital interactions manifesting as a cooperative Jahn-Teller effect. Epitaxial strain acts on octahedral rotations and crystal field symmetry to alter this complex lattice-orbit coupling. In this study, LaVO3 thin film structures have been investigated by X-ray diffraction and scanning transmission electron microscopy. The analysis shows two different orientations of octahedral tilt patterns, as well as two distinct temperature behaviors, for compressive and tensile film strain states. Ab initio calculations capture the strain effect on the tilt pattern orientation in agreement with experimental data.
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Research group Groupe Triscone
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MELEY, Hugo et al. Structural analysis of LaVO3 thin films under epitaxial strain. In: APL Materials, 2018, vol. 6, n° 4, p. 046102. doi: 10.1063/1.5021844 https://archive-ouverte.unige.ch/unige:105716

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Deposited on : 2018-06-19

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