Structural analysis of LaVO<sub>3</sub> thin films under epitaxial strain

Article Article scientifique Article Structural analysis of LaVO<sub>3</sub> thin films under epitaxial strain eng 2018 author Meley Hugo 827951 author Karandeep x author Oberson L. author De Bruijckere Joeri 837012 author Alexander D. T. L. author Triscone Jean-Marc 21933 author Ghosez Ph. author Gariglio Stefano 0000-0001-8263-4506 508404 046102 10.1063/1.5021844 2166-532X Rare earth vanadate perovskites exhibit a phase diagram in which two different types of structural distortions coexist: the strongest, the rotation of the oxygen octahedra, comes from the small tolerance factor of the perovskite cell (t = 0.88 forLaVO3) and the smaller one comes from inter-site d-orbital interactions manifesting as a cooperative Jahn-Teller effect. Epitaxial strain acts on octahedral rotations and crystal field symmetry to alter this complex lattice-orbit coupling. In this study, LaVO3 thin film structures have been investigated by X-ray diffraction and scanning transmission electron microscopy. The analysis shows two different orientations of octahedral tilt patterns, as well as two distinct temperature behaviors, for compressive and tensile film strain states. Ab initio calculations capture the strain effect on the tilt pattern orientation in agreement with experimental data. Dewey 500.2 33 Département de physique de la matière quantique 131 false 784 Groupe Triscone APL Materials 6 4 7d597e68-cdbf-4199-9c68-b6f339b93090 Article (Published version) Public 1.5021844.pdf 3125909 application/pdf CC BY openAccess Faculté des sciences / Section de physique / Département de physique de la matière quantique

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Structural analysis of LaVO₃ thin films under epitaxial strain	APL Materials			2018	640	195

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De Bruijckere, Joeri