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Temporal jitter in free-running InGaAs/InP single-photon avalanche detectors

Published in Optics Letters. 2016, vol. 41, no. 24, p. 5728
Abstract Negative-feedback avalanche diodes (NFADs) provide a practical solution for different single-photon counting applications requiring free-running mode operation with low afterpulsing probability. Unfortunately, the timing jitter has never been as good as for gated InGaAs/InP single-photon avalanche diodes. Here we report on the timing jitter characterization of InGaAs/InP based NFADs with particular focus on the temperature dependence and the effect of carrier transport between the absorption and multiplication regions. Values as low as 52 ps full-width at half-maximum were obtained at an excess bias voltage of 3.5 V and an operating temperature of around −100°C.
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Research group Groupe Zbinden
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AMRI, Emna et al. Temporal jitter in free-running InGaAs/InP single-photon avalanche detectors. In: Optics Letters, 2016, vol. 41, n° 24, p. 5728. https://archive-ouverte.unige.ch/unige:96309

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Deposited on : 2017-08-28

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