Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces
Published inApplied physics letters, vol. 108, no. 6, 061604
Publication date2016
Abstract
Keywords
- LaAlO3/SrTiO3 interface
- 2DEG
- Nanowires
- Atomic force microscopy
Affiliation entities
Research groups
Citation (ISO format)
BOSELLI, Margherita et al. Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces. In: Applied physics letters, 2016, vol. 108, n° 6, p. 061604. doi: 10.1063/1.4941817
Main files (1)
Article (Published version)
Identifiers
- PID : unige:84238
- DOI : 10.1063/1.4941817
Additional URL for this publicationhttp://scitation.aip.org/content/aip/journal/apl/108/6/10.1063/1.4941817
Journal ISSN0003-6951