Scientific article
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Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces

Published inApplied physics letters, vol. 108, no. 6, 061604
Publication date2016
Abstract

The realization of conducting nanostructures at the interface between LaAlO3 and SrTiO3 is an important step towards the realization of devices and the investigation of exotic physical regimes. We present here a detailed study of the conducting nanowires realized using the atomic force microscopy writing technique. By comparing experiments with numerical simulations, we show that these wires reproduce the ideal case of nanoconducting channels defined in an insulating background very well and that the tip bias is a powerful knob to modulate the size of these structures. We also discuss the role of the air humidity that is found to be a crucial parameter to set the size of the tip-sample effective interaction area.

Keywords
  • LaAlO3/SrTiO3 interface
  • 2DEG
  • Nanowires
  • Atomic force microscopy
Research groups
Citation (ISO format)
BOSELLI, Margherita et al. Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces. In: Applied physics letters, 2016, vol. 108, n° 6, p. 061604. doi: 10.1063/1.4941817
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Article (Published version)
accessLevelPublic
Identifiers
Journal ISSN0003-6951
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Technical informations

Creation03/06/2016 18:57:00
First validation03/06/2016 18:57:00
Update time15/03/2023 01:25:12
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