Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces
Published inApplied physics letters, vol. 108, no. 6, 061604
Publication date2016
Abstract
Keywords
- LaAlO3/SrTiO3 interface
- 2DEG
- Nanowires
- Atomic force microscopy
Research group
Citation (ISO format)
BOSELLI, Margherita et al. Characterization of atomic force microscopy written conducting nanowires at LaAlO<sub>3</sub>/SrTiO<sub>3</sub> interfaces. In: Applied physics letters, 2016, vol. 108, n° 6, p. 061604. doi: 10.1063/1.4941817
Main files (1)
Article (Published version)

Identifiers
- PID : unige:84238
- DOI : 10.1063/1.4941817
ISSN of the journal0003-6951