Scientific article
Open access

Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces

Published inApplied physics letters, vol. 108, no. 6, 061604
Publication date2016

The realization of conducting nanostructures at the interface between LaAlO3 and SrTiO3 is an important step towards the realization of devices and the investigation of exotic physical regimes. We present here a detailed study of the conducting nanowires realized using the atomic force microscopy writing technique. By comparing experiments with numerical simulations, we show that these wires reproduce the ideal case of nanoconducting channels defined in an insulating background very well and that the tip bias is a powerful knob to modulate the size of these structures. We also discuss the role of the air humidity that is found to be a crucial parameter to set the size of the tip-sample effective interaction area.

  • LaAlO3/SrTiO3 interface
  • 2DEG
  • Nanowires
  • Atomic force microscopy
Research group
Citation (ISO format)
BOSELLI, Margherita et al. Characterization of atomic force microscopy written conducting nanowires at LaAlO<sub>3</sub>/SrTiO<sub>3</sub> interfaces. In: Applied physics letters, 2016, vol. 108, n° 6, p. 061604. doi: 10.1063/1.4941817
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Article (Published version)
ISSN of the journal0003-6951

Technical informations

Creation06/03/2016 4:57:00 PM
First validation06/03/2016 4:57:00 PM
Update time03/15/2023 12:25:12 AM
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