Afterpulsing studies of low-noise InGaAs/InP single-photon negative-feedback avalanche diodes

Korzh, Boris; Lunghi, Tommaso; Kuzmenko, Kateryna; Boso, Gianluca; Zbinden, Hugo

doi:10.1080/09500340.2015.1024294

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Title		Afterpulsing studies of low-noise InGaAs/InP single-photon negative-feedback avalanche diodes
Authors		Korzh, Boris Lunghi, Tommaso Kuzmenko, Kateryna Boso, Gianluca Zbinden, Hugo
Published in		Journal of Modern Optics. 2015, vol. 62, no. 14, p. 1151-1157
Abstract		We characterise the temporal evolution of the afterpulse probability in a free-running negative-feedback avalanche diode (NFAD) over an extended range, from ns to ms. This is possible thanks to an extremely low dark count rate on the order of 1 cps at 10% efficiency, achieved by operating the NFAD at temperatures as low as 143 K. Experimental results in a large range of operating temperatures (223–143 K) are compared with a legacy afterpulsing model based on multiple trap families at discrete energy levels, which is found to be lacking in physical completeness. Subsequently, we expand on a recent proposal which considers a continuous spectrum of traps by introducing well-defined edges to the spectrum, which are experimentally observed.
Identifiers		DOI: 10.1080/09500340.2015.1024294
Full text		Article (Published version) (1 MB) - Limited access to UNIGE
Structures		Faculté des sciences / Section de physique / Groupe de physique appliquée
Research group		Groupe Zbinden
Citation (ISO format)		KORZH, Boris et al. Afterpulsing studies of low-noise InGaAs/InP single-photon negative-feedback avalanche diodes. In: Journal of Modern Optics, 2015, vol. 62, n° 14, p. 1151-1157. doi: 10.1080/09500340.2015.1024294 https://archive-ouverte.unige.ch/unige:84122