Scientific article

Afterpulsing studies of low-noise InGaAs/InP single-photon negative-feedback avalanche diodes

Published inJournal of modern optics, vol. 62, no. 14, p. 1151-1157
Publication date2015

We characterise the temporal evolution of the afterpulse probability in a free-running negative-feedback avalanche diode (NFAD) over an extended range, from ns to ms. This is possible thanks to an extremely low dark count rate on the order of 1 cps at 10% efficiency, achieved by operating the NFAD at temperatures as low as 143 K. Experimental results in a large range of operating temperatures (223–143 K) are compared with a legacy afterpulsing model based on multiple trap families at discrete energy levels, which is found to be lacking in physical completeness. Subsequently, we expand on a recent proposal which considers a continuous spectrum of traps by introducing well-defined edges to the spectrum, which are experimentally observed.

Research group
Citation (ISO format)
KORZH, Boris et al. Afterpulsing studies of low-noise InGaAs/InP single-photon negative-feedback avalanche diodes. In: Journal of modern optics, 2015, vol. 62, n° 14, p. 1151–1157. doi: 10.1080/09500340.2015.1024294
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Article (Published version)
ISSN of the journal0950-0340

Technical informations

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