Micro-crystalline inclusions analysis by PIXE and RBS

Strivay, D.; Ramboz, C.; Gallien, J.-P.; Grambole, D.; Sauvage, T.; Kouzmanov, Kalin

doi:10.1016/j.nimb.2008.03.068

Scientific article

English

Micro-crystalline inclusions analysis by PIXE and RBS

Contributors

Strivay, D.; Ramboz, C.; Gallien, J.-P.; Grambole, D.; Sauvage, T.; Kouzmanov, Kalin

Published in

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, vol. 266, no. 10, p. 2375-2378

Publication date

2008

Abstract

A characteristic feature of the nuclear microprobe using a 3 MeV proton beam is the long range of particles (around 70 lm in light matrices). The PIXE method, with EDS analysis and using the multilayer approach for treating the X-ray spectrum allows the chemistry of an intra-crystalline inclusion to be measured, provided the inclusion roof and thickness at the impact point of the beam (Z and e, respectively) are known (the depth of the inclusion floor is Z + e). The parameter Z of an inclusion in a mineral can be measured with a precision of around 1 lm using a motorized microscope. However, this value may significantly depart from Z if the analyzed inclusion has a complex shape. The parameter e can hardly be measured optically. By using combined RBS and PIXE measurements, it is possible to obtain the geometrical information needed for quantitative elemental analysis. This paper will present measurements on synthetic samples to investigate the advantages of the technique, and also on natural solid and fluid inclusions in quartz. The influence of the geometrical parameters will be discussed with regard to the concentration determination by PIXE. In particular, accuracy of monazite microinclusion dating by coupled PIXE–RBS will be presented.

UNIGE affiliation entities

Faculté des sciences / Section des sciences de la Terre et de l'Environnement / Département des sciences de la Terre

UNIGE research groups

Mineral Resources and Geofluids

Citation (ISO format)

STRIVAY, D. et al. Micro-crystalline inclusions analysis by PIXE and RBS. In: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2008, vol. 266, n° 10, p. 2375–2378. doi: 10.1016/j.nimb.2008.03.068

Article (Published version)

Identifiers

PID : unige:76240
DOI : 10.1016/j.nimb.2008.03.068

Additional URL for this publication

http://linkinghub.elsevier.com/retrieve/pii/S0168583X08002711

Journal ISSN

0168-583X

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16/10/2015 14:47:00

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18/09/2025 14:06:16

Micro-crystalline inclusions analysis by PIXE and RBS

Contributors

Published in

Publication date

Abstract

UNIGE affiliation entities

UNIGE research groups

Citation (ISO format)

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Additional URL for this publication

Journal ISSN

Technical informations

Creation

First validation

Update

Status update

Last indexation