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Proceedings chapter
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Localization properties of an EEG sensor system: lower bounds and optimality

Contributors

Alecu, Teodor; Voloshynovskyy, Svyatoslav; Pun, Thierry

Presented at

Vienna (Austria), Sept. 6-10

Published in

Proceedings of the 12th European Signal Processing Conference, EUSIPCO 2004

Publication date

2004

Abstract

Most studies concerning the EEG inverse problem focus on the properties of one or another specific inverse solution. Few studies approach the problem of the bounds imposed by the system itself, indifferently of the inversion method used. We are interested in the localization properties of an EEG sensor system using a generic reconstruction procedure in the context of a Brain Computer Interface project. We investigate various perturbations: additive noise, electrode misplacement errors and external sources contributions. The estimation of errors uses the notions of normalized measurements and sensitivity functions in a deterministic framework, but our results closely link to the stochastic CramerRao minimum bound. We propose to modify the system, and more specifically the electrodes configuration, such as to minimize the forecasted errors, thus enhancing the robustness of the system. The configurations obtained through a hybrid Simulated Annealing - Gradient Descent approach show significant improvement when compared to normal setups.

Keywords

  • Brain-computer interfaces
  • Electroencephalography
  • Inverse problems
  • Sensor placement
  • Simulated annealing
  • Stochastic processes

UNIGE affiliation entities

UNIGE research groups

Citation (ISO format)

ALECU, Teodor, VOLOSHYNOVSKYY, Svyatoslav, PUN, Thierry. Localization properties of an EEG sensor system: lower bounds and optimality. In: Proceedings of the 12th European Signal Processing Conference, EUSIPCO 2004. Vienna (Austria). [s.l.] : [s.n.], 2004.

Main files (2)

Proceedings chapter (Published version)
Proceedings chapter (Accepted version)

Identifiers

  • PID : unige:47708

Additional URL for this publication

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7079717
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Technical informations

Creation

06/03/2015 17:12:09

First validation

06/03/2015 17:12:09

Update

14/03/2023 22:58:46

Status update

14/03/2023 22:58:46

Last indexation

30/10/2024 23:18:26
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