Statistics of edge areas in quantitative EELS imaging: signal-to-noise ratio and minimum detectable signal
ContributorsPun, Thierry; Ellis, James R.
Published inMicrobeam analysis, p. 156-162
Publication date1983
Citation (ISO format)
PUN, Thierry, ELLIS, James R. Statistics of edge areas in quantitative EELS imaging: signal-to-noise ratio and minimum detectable signal. In: Microbeam analysis, 1983, p. 156–162.
Identifiers
- PID : unige:47524
ISSN of the journal1061-3420