Optimized acquisition parameters and statistical detection limit in quantitative EELS
ContributorsPun, Thierry; Ellis, James R.; Eden, Murray
Published inJournal of microscopy, vol. 135, no. 3, p. 295-316
Publication date1984
Abstract
Keywords
- EELS
- signal-to-noise ratio
- statistics
- optimization
- detection limit
- modelling
- visual contrast
- image processing
Affiliation entities
Citation (ISO format)
PUN, Thierry, ELLIS, James R., EDEN, Murray. Optimized acquisition parameters and statistical detection limit in quantitative EELS. In: Journal of microscopy, 1984, vol. 135, n° 3, p. 295–316. doi: 10.1111/j.1365-2818.1984.tb02535.x
Main files (1)
Article (Published version)
Identifiers
- PID : unige:47454
- DOI : 10.1111/j.1365-2818.1984.tb02535.x
Journal ISSN0022-2720
