Weighted least squares estimation of background in EELS imaging
ContributorsPun, Thierry; Ellis, James R.; Eden, Murray
Published inJournal of microscopy, vol. 137, no. 1, p. 93-100
Publication date1985
Abstract
Keywords
- EELS
- least squares estimation
- optimization
- statistics
- signal-to-noise ratio
Citation (ISO format)
PUN, Thierry, ELLIS, James R., EDEN, Murray. Weighted least squares estimation of background in EELS imaging. In: Journal of microscopy, 1985, vol. 137, n° 1, p. 93–100. doi: 10.1111/j.1365-2818.1985.tb02565.x
Main files (1)
Article (Published version)
Identifiers
- PID : unige:47453
- DOI : 10.1111/j.1365-2818.1985.tb02565.x
ISSN of the journal0022-2720