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Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface

Salluzzo, M.
Torrelles, X.
Di Capua, R.
Drnec, J.
Sala, M. Moretti
Ghiringhelli, G.
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Published in Advanced Materials. 2013, vol. 25, no. 16, p. 2333-2338
Abstract A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.
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Other version: http://doi.wiley.com/10.1002/adma.201204555
Research group Groupe Triscone
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SALLUZZO, M. et al. Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface. In: Advanced Materials, 2013, vol. 25, n° 16, p. 2333-2338. https://archive-ouverte.unige.ch/unige:47222

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Deposited on : 2015-02-24

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