Scientific article

Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface

Published inAdvanced materials, vol. 25, no. 16, p. 2333-2338
Publication date2013

A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.

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Citation (ISO format)
SALLUZZO, M. et al. Structural and Electronic Reconstructions at the LaAlO<sub>3</sub>/SrTiO<sub>3</sub> Interface. In: Advanced materials, 2013, vol. 25, n° 16, p. 2333–2338. doi: 10.1002/adma.201204555
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Article (Published version)
ISSN of the journal0935-9648

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