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Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface

ContributorsSalluzzo, M.; Gariglio, Stefanoorcid; Torrelles, X.; Ristic, Zoran; Di Capua, R.; Drnec, J.; Sala, M. Moretti; Ghiringhelli, G.; Felici, R.; Brookes, N. B.
Published inAdvanced materials, vol. 25, no. 16, p. 2333-2338
Publication date2013
Abstract

A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.

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SALLUZZO, M. et al. Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface. In: Advanced materials, 2013, vol. 25, n° 16, p. 2333–2338. doi: 10.1002/adma.201204555
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Journal ISSN0935-9648
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