Scientific article
English

Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface

Published inAdvanced materials, vol. 25, no. 16, p. 2333-2338
Publication date2013
Abstract

A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.

UNIGE research groups
Citation (ISO format)
SALLUZZO, M. et al. Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface. In: Advanced materials, 2013, vol. 25, n° 16, p. 2333–2338. doi: 10.1002/adma.201204555
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Journal ISSN0935-9648
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