Shot-Noise-Induced Charge and Potential Fluctuations of Edge States in Proximity of a Gate
ContributorsButtiker, Markus
Published in26th Sitges Conference : Statistical and Dynamical Aspects of Mesoscopic Systems, p. 81-95
PublisherBerlin : Springer
Collection
- Lecture Notes in Physics; 547
Publication date2000
Abstract
Affiliation entities
Citation (ISO format)
BUTTIKER, Markus. Shot-Noise-Induced Charge and Potential Fluctuations of Edge States in Proximity of a Gate. In: 26th Sitges Conference : Statistical and Dynamical Aspects of Mesoscopic Systems. Berlin : Springer, 2000. p. 81–95. (Lecture Notes in Physics) doi: 10.1007/3-540-45557-4_8
Main files (1)
Proceedings chapter
Identifiers
- PID : unige:4485
- DOI : 10.1007/3-540-45557-4_8
- arXiv : cond-mat/9908116
ISBN978-3-540-67478-8
