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Multi-terminal scattering approach to conductance and noise at scanning tunnelling microscope tips

Published in Surface and Interface Analysis. 1999, vol. 27, no. 5-6, p. 550-554
Abstract Experiments that measure the average current and current fluctuations at one or two local tunnelling contacts on a mesoscopic multiprobe conductor are proposed and theoretically investigated. The average current and the current fluctuations at a single tunnelling tip are determined by an effective local distribution function, which is given as the product of local partial densities of states (injectivities) and the Fermi distribution functions in the electron reservoirs. The current correlations at two tips connected to a phase-coherent conductor are determined by spatially non-diagonal density of states elements and can give information about the phase and correlations of wavefunctions. All results are illustrated for measurements on a ballistic wire and on a metallic diffusive wire.
Keywords Scanning tunneling microscopyLocal density of statesShot noiseSTMCurrent fluctuationsElectronic structureTip surface interactionsShot noiseElectrical conductanceMeasuring methodsTheoretical study
Note Special Issue: Papers Presented at the SXM-3 Conference. 3rd Conference on Development and Industrial Application of Scanning Probe Methods (SXM-3), University of Basel, Basel, Switzerland, 16 September 1998 to 19 September 1998.
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GRAMESPACHER, Thomas, BUTTIKER, Markus. Multi-terminal scattering approach to conductance and noise at scanning tunnelling microscope tips. In: Surface and Interface Analysis, 1999, vol. 27, n° 5-6, p. 550-554. doi: 10.1002/(sici)1096-9918(199905/06)27:5/6<550::aid-sia511>3.0.co;2-d https://archive-ouverte.unige.ch/unige:4230

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Deposited on : 2009-11-30

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