Multi-terminal scattering approach to conductance and noise at scanning tunnelling microscope tips
ContributorsGramespacher, Thomas; Buttiker, Markus
Published inSurface and interface analysis, vol. 27, no. 5-6, p. 550-554
Publication date1999
Abstract
Keywords
- Scanning tunneling microscopy
- Local density of states
- Shot noise
- STM
- Current fluctuations
- Electronic structure
- Tip surface interactions
- Shot noise
- Electrical conductance
- Measuring methods
- Theoretical study
NoteSpecial Issue: Papers Presented at the SXM-3 Conference. 3rd Conference on Development and Industrial Application of Scanning Probe Methods (SXM-3), University of Basel, Basel, Switzerland, 16 September 1998 to 19 September 1998.
Affiliation entities
Citation (ISO format)
GRAMESPACHER, Thomas, BUTTIKER, Markus. Multi-terminal scattering approach to conductance and noise at scanning tunnelling microscope tips. In: Surface and interface analysis, 1999, vol. 27, n° 5-6, p. 550–554. doi: 10.1002/(sici)1096-9918(199905/06)27:5/6<550::aid-sia511>3.0.co;2-d
Identifiers
- PID : unige:4230
- DOI : 10.1002/(sici)1096-9918(199905/06)27:5/6<550::aid-sia511>3.0.co;2-d
Journal ISSN0142-2421
