Scientific article
Open access

Current-voltage correlations in interferometers

Published inNew journal of physics, vol. 9, no. 117, 24
Publication date2007

We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in interferometers with a one-channel dephasing or voltage probe are identical. Nevertheless, the distribution function for voltage and the distribution function for occupation number fluctuations differ, the latter being broader than that of the former in all examples considered here.

  • Mesoscopic systems and quantum hall effect
  • Condensed matter
Citation (ISO format)
FORSTER, Heidi, SAMUELSSON, Martin Peter, BUTTIKER, Markus. Current-voltage correlations in interferometers. In: New journal of physics, 2007, vol. 9, n° 117, p. 24. doi: 10.1088/1367-2630/9/5/117
Main files (1)
ISSN of the journal1367-2630

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