Scientific article
English

Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments

ContributorsHara, K.
Publication date2011
Abstract

We are developing n+-in-p, p-bulk and n-readout, microstrip sensors, fabricated by Hamamatsu Photonics, as a non-inverting radiation hard silicon detector for the ATLAS tracker upgrade at the super-LHC (sLHC) proposed facility. The bulk radiation damage after neutron and proton irradiations is characterized with the leakage current, charge collection and full depletion voltage. The detectors should provide acceptable signal, signal-to-noise ratio exceeding 15, after the integrated luminosity of 6000 fb−1, which is twice the sLHC integrated luminosity goal.

Keywords
  • P-Bulk silicon
  • Microstrip
  • Charge collection
  • Radiation damage
Citation (ISO format)
HARA, K. Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments. In: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2011, vol. 636, n° 1, p. S83–S89. doi: 10.1016/j.nima.2010.04.090
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Article (Published version)
accessLevelRestricted
Identifiers
Journal ISSN0168-9002
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Technical informations

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