Photon-Counting OTDR for Local Birefringence and Fault Analysis in the Metro Environment
ContributorsWegmuller, Mark; Scholder, François; Gisin, Nicolas
Published inJournal of lightwave technology, vol. 22, no. 2, p. 390-400
Publication date2004
Abstract
Keywords
- Birefringence: distributed, detection
- Metrology
- Optical time-domain reflectometry
- Photon counting
- Polarization-sensitive backscattering technique
Affiliation entities
Citation (ISO format)
WEGMULLER, Mark, SCHOLDER, François, GISIN, Nicolas. Photon-Counting OTDR for Local Birefringence and Fault Analysis in the Metro Environment. In: Journal of lightwave technology, 2004, vol. 22, n° 2, p. 390–400. doi: 10.1109/JLT.2004.824355
Main files (1)
Article (Published version)
Identifiers
- PID : unige:36727
- DOI : 10.1109/JLT.2004.824355
Additional URL for this publicationhttp://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=1278478
Journal ISSN0733-8724
