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Domain Wall Roughness in Stripe Phase BiFeO3 Thin Films

Published in Physical Review Letters. 2013, vol. 111, no. 24, p. 247604
Abstract Using the model system of ferroelectric domain walls, we explore the effects of long-range dipolar interactions and periodic ordering on the behavior of pinned elastic interfaces. In piezoresponse force microscopy studies of the characteristic roughening of intrinsic 71 degree stripe domains in BiFeO3 thin films, we find unexpectedly high values of the roughness exponent zeta = 0.74 +- 0.10, significantly different from those obtained for artificially written domain walls in this and other ferroelectric materials. The large value of the exponent suggests that a random field-dominated pinning, combined with stronger disorder and strain effects due to the step-bunching morphology of the samples, could be the dominant source of pinning in the system.
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Research group Groupe Giamarchi
Project FNS: Division II
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ZIEGLER, Benedikt et al. Domain Wall Roughness in Stripe Phase BiFeO3 Thin Films. In: Physical Review Letters, 2013, vol. 111, n° 24, p. 247604. https://archive-ouverte.unige.ch/unige:35412

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Deposited on : 2014-04-08

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