Domain Wall Roughness in Stripe Phase BiFeO3 Thin Films
ContributorsZiegler, Benedikt; Martens, Kirsten; Giamarchi, Thierry; Paruch, Patrycja
Published inPhysical review letters, vol. 111, no. 24, 247604
Publication date2013
Abstract
Affiliation entities
Research groups
Funding
- Swiss National Science Foundation - Division II
Citation (ISO format)
ZIEGLER, Benedikt et al. Domain Wall Roughness in Stripe Phase BiFeO3 Thin Films. In: Physical review letters, 2013, vol. 111, n° 24, p. 247604. doi: 10.1103/PhysRevLett.111.247604
Main files (1)
Article (Published version)
Identifiers
- PID : unige:35412
- DOI : 10.1103/PhysRevLett.111.247604
Journal ISSN0031-9007