en
Scientific article
Open access
English

Shot noise measurements in graphene

Published inSolid state communications, vol. 149, no. 27-28, p. 1050-1055
Publication date2009
Abstract

We have investigated shot noise at microwave frequencies in wide-aspect-ratio graphene sheets in the temperature range of 4.2_30 K. We find that for our short .L < 300 nm/ graphene samples with width over length ratio W=L > 3, the Fano factor F reaches a maximum F _ 1=3 at the Dirac point and that it decreases substantially with increasing charge density. Our results agree with the theoretical prediction that electrical transport at the Dirac point is governed by evanescent electronic states.

Keywords
  • Nanostructures
  • Electronic transport
  • Noise
Research group
Citation (ISO format)
DANNEAU, R. et al. Shot noise measurements in graphene. In: Solid state communications, 2009, vol. 149, n° 27-28, p. 1050–1055. doi: 10.1016/j.ssc.2009.02.046
Main files (1)
Article (Published version)
accessLevelPublic
Identifiers
ISSN of the journal0038-1098
552views
311downloads

Technical informations

Creation03/25/2014 1:27:00 PM
First validation03/25/2014 1:27:00 PM
Update time03/14/2023 9:03:29 PM
Status update03/14/2023 9:03:28 PM
Last indexation01/16/2024 2:12:35 PM
All rights reserved by Archive ouverte UNIGE and the University of GenevaunigeBlack