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Growth an dielectric characterization of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3 single crystals

Presented at Urbana, USA, 6-8 juin 1990
PublisherPiscataway : Institute of Electrical & Electronics Engineers (IEEE) Inc.,US
Publication date1991
Citation (ISO format)
SCHMID, Hans, YE, Z.G., RIVERA, Jean-Pierre. Growth an dielectric characterization of relaxor ferroelectric Pb(Mg<sub>1/3</sub>Nb<sub>2/3</sub>)O<sub>3</sub> single crystals. In: 1990 IEEE 7th International Symposium on Applications of Ferroelectrics. Urbana, USA. Piscataway : Institute of Electrical & Electronics Engineers (IEEE) Inc.,US, 1991. p. 482–485.
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Proceedings chapter (Published version)
accessLevelPublic
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  • PID : unige:34213
ISBN978-0-7803-0190-0
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