Growth an dielectric characterization of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3 single crystals

Schmid, Hans; Ye, Z.G.; Rivera, Jean-Pierre

Proceedings chapter

English

Growth an dielectric characterization of relaxor ferroelectric Pb(Mg_1/3Nb_2/3)O₃ single crystals

ContributorsSchmid, Hans; Ye, Z.G.; Rivera, Jean-Pierre

Presented atUrbana, USA, 6-8 juin 1990

Published in1990 IEEE 7th International Symposium on Applications of Ferroelectrics, p. 482-485

PublisherPiscataway : Institute of Electrical & Electronics Engineers (IEEE) Inc.,US

Publication date1991

Affiliation entities

Faculté des sciences / Section de chimie et biochimie / Département de chimie minérale, analytique et appliquée

Citation (ISO format)

SCHMID, Hans, YE, Z.G., RIVERA, Jean-Pierre. Growth an dielectric characterization of relaxor ferroelectric Pb(Mg_1/3Nb_2/3)O₃ single crystals. In: 1990 IEEE 7th International Symposium on Applications of Ferroelectrics. Urbana, USA. Piscataway : Institute of Electrical & Electronics Engineers (IEEE) Inc.,US, 1991. p. 482–485.

Proceedings chapter (Published version)

Identifiers

PID : unige:34213

ISBN978-0-7803-0190-0

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Growth an dielectric characterization of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3 single crystals

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Growth an dielectric characterization of relaxor ferroelectric Pb(Mg_1/3Nb_2/3)O₃ single crystals