Domain Wall Roughness in Epitaxial Ferroelectric PbZr0.2Ti0.8O3 Thin Films

Paruch, Patrycja; Giamarchi, Thierry; Triscone, Jean-Marc

doi:10.1103/PhysRevLett.94.197601

Scientific article

English

Domain Wall Roughness in Epitaxial Ferroelectric PbZr_0.2Ti_0.8O₃ Thin Films

ContributorsParuch, Patrycja; Giamarchi, Thierry; Triscone, Jean-Marc

Published inPhysical review letters, vol. 94, no. 19, 197601

Publication date2005

Affiliation entities

Faculté des sciences / Section de physique / Département de physique de la matière quantique

Research groups

Citation (ISO format)

PARUCH, Patrycja, GIAMARCHI, Thierry, TRISCONE, Jean-Marc. Domain Wall Roughness in Epitaxial Ferroelectric PbZr_0.2Ti_0.8O₃ Thin Films. In: Physical review letters, 2005, vol. 94, n° 19, p. 197601. doi: 10.1103/PhysRevLett.94.197601

Article (Published version)

Identifiers

PID : unige:31051
DOI : 10.1103/PhysRevLett.94.197601

Journal ISSN0031-9007

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Domain Wall Roughness in Epitaxial Ferroelectric PbZr0.2Ti0.8O3 Thin Films

Technical informations

Domain Wall Roughness in Epitaxial Ferroelectric PbZr_0.2Ti_0.8O₃ Thin Films