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Domain Wall Roughness in Epitaxial Ferroelectric PbZr0.2Ti0.8O3 Thin Films

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Published in Physical Review Letters. 2005, vol. 94, no. 19, p. 197601
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PARUCH, Patrycja, GIAMARCHI, Thierry, TRISCONE, Jean-Marc. Domain Wall Roughness in Epitaxial Ferroelectric PbZr0.2Ti0.8O3 Thin Films. In: Physical Review Letters, 2005, vol. 94, n° 19, p. 197601. https://archive-ouverte.unige.ch/unige:31051

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Deposited on : 2013-11-13

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