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Investigation of Ferroelectricity in Ultrathin PbTiO3 Films

Published in Integrated Ferroelectrics. 2004, vol. 61, no. 1, p. 143-148
Abstract Using off-axis magnetron sputtering onto metallic Nb-SrTiO3 substrates, we have grown a series of epitaxial c-axis oriented PbTiO3 perovskite films with thicknesses ranging from 460 A ̊ down to 12 A ̊ (about 3 unit cells). Topographic measurements using atomic force microscopy showed that these films are essentially atomically smooth. X-ray measurements allowed us to precisely determine the thickness of the films and the c-axis lattice parameter value, and to confirm epitaxial growth. It is found that the c-axis lattice parameter systematically decreases with decreasing film thickness.
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Research group Groupe Triscone
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LICHTENSTEIGER, Céline, TRISCONE, Jean-Marc. Investigation of Ferroelectricity in Ultrathin PbTiO3 Films. In: Integrated Ferroelectrics, 2004, vol. 61, n° 1, p. 143-148. https://archive-ouverte.unige.ch/unige:23536

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Deposited on : 2012-10-24

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