Testbeam characterization of a SiGe BiCMOS monolithic silicon pixel detector with internal gain layer
ContributorsPaolozzi, Lorenzo; Milanesio, Matteo
; Moretti, Théo
; Cardella, Roberto Calogero; Kugathasan, Thanushan; Picardi, Antonio; Elviretti, M.; Rücker, H.; Cadoux, Franck; Cardarelli, Roberto; Cecconi, Léonardo; Débieux, Stéphane; Favre, Yannick; Fenoglio, Carlo Alberto; Ferrere, Didier; Gonzalez Sevilla, Sergio; Iodice, Luca; Kotitsa, Rafaella Eleni; Magliocca, Chiara; Nessi, M.; Pizarro Medina, Andrea; Saidi, J.; Vicente Barreto Pinto, Mateus; Zambito, Stefano; Iacobucci, Giuseppe
Published inJournal of instrumentation, vol. 20, no. 04, p. P04001
Publication date2025
First online date2025-04-01
Abstract
Keywords
- Particle tracking detectors
- Solid state detectors
- Time projection chambers
Affiliation entities
Research groups
Citation (ISO format)
PAOLOZZI, Lorenzo et al. Testbeam characterization of a SiGe BiCMOS monolithic silicon pixel detector with internal gain layer. In: Journal of instrumentation, 2025, vol. 20, n° 04, p. P04001. doi: 10.1088/1748-0221/20/04/p04001
Main files (1)
Article (Published version)
Identifiers
- PID : unige:192496
- DOI : 10.1088/1748-0221/20/04/p04001
- arXiv : 2412.07606
Additional URL for this publicationhttps://iopscience.iop.org/article/10.1088/1748-0221/20/04/P04001
Journal ISSN1748-0221
