Radiation tolerance of SiGe BiCMOS monolithic silicon pixel detectors without internal gain layer
ContributorsMilanesio, Matteo
; Paolozzi, Lorenzo; Moretti, Théo
; Cardella, Roberto Calogero; Kugathasan, Thanushan; Martinelli, Fulvio; Picardi, Antonio; Semendyaev, Ivan; Zambito, Stefano; Nakamura, K.; Tabuko, Y.; Togawa, M.; Elviretti, M.; Rücker, H.; Cadoux, Franck; Cardarelli, Roberto; Débieux, Stéphane; Favre, Yannick; Fenoglio, Carlo Alberto; Ferrere, Didier; Gonzalez Sevilla, Sergio; Iodice, Luca
; Kotitsa, Rafaella Eleni; Magliocca, Chiara
; Nessi, Marzio; Pizarro Medina, Andrea; Sabater Iglesias, Jorge; Saidi, Jihad
; Vicente Barreto Pinto, Mateus; Iacobucci, Giuseppe
Published inJournal of instrumentation, vol. 19, no. 01, p. 01014
Publication date2024
First online date2024-01-15
Abstract
Keywords
- Particle tracking detectors (Solid-state detectors)
- Pixelated detectors and associated VLSI electronics
- Timing detectors
- Instrumentation and methods for time-of-flight (TOF) spectroscopy
Affiliation entities
Research groups
Citation (ISO format)
MILANESIO, Matteo et al. Radiation tolerance of SiGe BiCMOS monolithic silicon pixel detectors without internal gain layer. In: Journal of instrumentation, 2024, vol. 19, n° 01, p. 01014. doi: 10.1088/1748-0221/19/01/p01014
Main files (1)
Article (Published version)
Identifiers
- PID : unige:188836
- DOI : 10.1088/1748-0221/19/01/p01014
- arXiv : 2310.19398
Additional URL for this publicationhttps://iopscience.iop.org/article/10.1088/1748-0221/19/01/P01014
Journal ISSN1748-0221
