Testbeam results of irradiated SiGe BiCMOS monolithic silicon pixel detector without internal gain layer
ContributorsMoretti, Théo
; Milanesio, Matteo
; Cardella, Roberto Calogero; Kugathasan, Thanushan; Picardi, Antonio; Semendyaev, Ivan; Elviretti, M.; Rücker, H.; Nakamura, K.; Takubo, Y.; Togawa, M.; Cadoux, Franck; Cardarelli, Roberto; Cecconi, Léonardo; Débieux, Stéphane; Favre, Yannick; Fenoglio, Carlo Alberto; Ferrere, Didier; Gonzalez Sevilla, Sergio; Iodice, Luca
; Kotitsa, Rafaella Eleni; Magliocca, Chiara
; Nessi, Marzio; Pizarro Medina, Andrea; Sabater Iglesias, Jorge; Saidi, Jihad
; Vicente Barreto Pinto, Mateus; Zambito, Stefano; Paolozzi, Lorenzo; Iacobucci, Giuseppe
Published inJournal of instrumentation, vol. 19, no. 07, p. 07036
Publication date2024
First online date2024-07-29
Abstract
Keywords
- Particle tracking detectors (Solid-state detectors)
- Radiation-hard detectors
- Solid state detectors
- Semiconductor detector: pixel
- Noise: low
- Efficiency
- P: irradiation
- Pi: irradiation
- Silicon
- Germanium
- Integrated circuit
- Electronics: readout
- Time resolution
- Radiation: damage
- Performance
Affiliation entities
Research groups
Citation (ISO format)
MORETTI, Théo et al. Testbeam results of irradiated SiGe BiCMOS monolithic silicon pixel detector without internal gain layer. In: Journal of instrumentation, 2024, vol. 19, n° 07, p. 07036. doi: 10.1088/1748-0221/19/07/p07036
Main files (1)
Article (Published version)
Identifiers
- PID : unige:188833
- DOI : 10.1088/1748-0221/19/07/p07036
- arXiv : 2404.12885
Additional URL for this publicationhttps://iopscience.iop.org/article/10.1088/1748-0221/19/07/P07036
Journal ISSN1748-0221
