Sequential testing in batches with resource constraints
ContributorsYang, Fan
; Hermans, Ben; Zufferey, Nicolas
; Leus, Roel
Published inExpert systems with applications, vol. 256, p. 124858
Publication date2024-12
Abstract
Keywords
- Sequential testing
- Serial system
- Batch processing
- Tabu search
- Proximity search
Affiliation entities
Citation (ISO format)
YANG, Fan et al. Sequential testing in batches with resource constraints. In: Expert systems with applications, 2024, vol. 256, p. 124858. doi: 10.1016/j.eswa.2024.124858
Main files (1)
Article (Accepted version)
Identifiers
- PID : unige:179317
- DOI : 10.1016/j.eswa.2024.124858
Additional URL for this publicationhttps://linkinghub.elsevier.com/retrieve/pii/S0957417424017251
Journal ISSN0957-4174
