X-ray and photoelectron spectroscopy for the determination of 4f energies of rare earths

Bonnelle, Christiane; Karnatak, Ramesh Chandra; Joergensen, Christian

doi:10.1016/0009-2614(72)87165-3

Scientific article

Letter

English

X-ray and photoelectron spectroscopy for the determination of 4f energies of rare earths

ContributorsBonnelle, Christiane; Karnatak, Ramesh Chandra; Joergensen, Christian

Published inChemical physics letters, vol. 14, no. 2, p. 145-149

Publication date1972-05

Abstract

The energy and the effects of interelectronic repulsion of the 4f shell in metallic lanthanides and their oxides are discussed based on recent measurements of X-ray and photoelectron spectra.

Affiliation entities

Faculté des sciences / Section de chimie et biochimie / Département de chimie physique

Citation (ISO format)

BONNELLE, Christiane, KARNATAK, Ramesh Chandra, JOERGENSEN, Christian. X-ray and photoelectron spectroscopy for the determination of 4f energies of rare earths. In: Chemical physics letters, 1972, vol. 14, n° 2, p. 145–149. doi: 10.1016/0009-2614(72)87165-3

Article (Published version)

Identifiers

PID : unige:178810
DOI : 10.1016/0009-2614(72)87165-3

Additional URL for this publicationhttps://linkinghub.elsevier.com/retrieve/pii/0009261472871653

Journal ISSN0009-2614

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X-ray and photoelectron spectroscopy for the determination of 4f energies of rare earths

The energy and the effects of interelectronic repulsion of the 4f shell in metallic lanthanides and their oxides are discussed based on recent measurements of X-ray and photoelectron spectra.

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