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Scientific article
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Submersible voltammetric probes for in situ real-time trace element measurements in surface water, groundwater and sediment-water interface

Published inMeasurement science & technology, vol. 10, no. 12, p. 1202-1213
Publication date1999-12-01
First online date1999-11-24
Abstract

A summary of the state of the art in the development of two submersible voltammetric probes performed by us to allow continuous, real-time monitoring of trace elements (Cu(II), Pb(II), Cd(II), Zn(II) and Mn(II), Fe(II)) in natural aquatic ecosystems is given. The first one, called the voltammetric in situ (VIP) profiling system, allowed in situ measurements in surface water and groundwater down to 500 m. Its construction required the development of: (i) a gel-integrated, either single or interconnected, array microsensor, (ii) a submersible probe and (iii) hardware, firmware and software for control of the whole system: i.e. data transmission and acquisition, data processing and maintenance operations. The second system, called the sediment-water interface voltammetric in situ profiling (SIVIP) system, has been developed to allow real-time, high spatial resolution trace elements concentration profile measurements at the sediment-water interface. Its construction required the development of: (i) a gel-integrated microsensor array with 64 individually addressable lines, (ii) a voltammetric probe based on powerful double multiplexing system and single potentiostat allowing simultaneous measurements over the 64 sensor lines, and (iii) hardware, firmware and software for control of the whole system. A general description of both systems as well as examples of laboratory characterization and/or field applications are reported.

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Keywords
  • Voltammetric probes
  • Ediment-water interface
Citation (ISO format)
TERCIER WAEBER, Marie-Louise et al. Submersible voltammetric probes for <i>in situ</i> real-time trace element measurements in surface water, groundwater and sediment-water interface. In: Measurement science & technology, 1999, vol. 10, n° 12, p. 1202–1213. doi: 10.1088/0957-0233/10/12/312
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ISSN of the journal0957-0233
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