Degradation of Ic due to residual stress in high-performance Nb3Sn wires submitted to compressive transverse force
ContributorsSenatore, Carmine ; Bagni, Tommaso ; Ferradas Troitino, José ; Bordini, B; Ballarino, A
Published inSuperconductor science and technology, vol. 36, no. 7, 075001
Publication date2023-05-17
First online date2023-05-17
Abstract
Research groups
Citation (ISO format)
SENATORE, Carmine et al. Degradation of Ic due to residual stress in high-performance Nb3Sn wires submitted to compressive transverse force. In: Superconductor science and technology, 2023, vol. 36, n° 7, p. 075001. doi: 10.1088/1361-6668/acca50
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Article (Published version)
Identifiers
- PID : unige:168831
- DOI : 10.1088/1361-6668/acca50
ISSN of the journal0953-2048