Quantitative analysis of electronic transport through weakly coupled metal/organic interfaces

Molinari, A. S.; Gutiérrez Lezama, I.; Parisse, P.; Takenobu, T.; Iwasa, Y.; Morpurgo, Alberto

doi:10.1063/1.2904629

Scientific article

English

Quantitative analysis of electronic transport through weakly coupled metal/organic interfaces

ContributorsMolinari, A. S.; Gutiérrez Lezama, I.; Parisse, P.; Takenobu, T.; Iwasa, Y.; Morpurgo, Alberto

Published inApplied physics letters, vol. 92, no. 13, 133303

Publication date2008-03-31

Affiliation entities

Faculté des sciences

Research groups

Groupe Morpurgo

Citation (ISO format)

MOLINARI, A. S. et al. Quantitative analysis of electronic transport through weakly coupled metal/organic interfaces. In: Applied physics letters, 2008, vol. 92, n° 13, p. 133303. doi: 10.1063/1.2904629

Article (Published version)

Identifiers

PID : unige:156199
DOI : 10.1063/1.2904629

Additional URL for this publicationhttp://aip.scitation.org/doi/10.1063/1.2904629

Journal ISSN0003-6951

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Quantitative analysis of electronic transport through weakly coupled metal/organic interfaces

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