Bias-dependent contact resistance in rubrene single-crystal field-effect transistors
Published inApplied physics letters, vol. 90, no. 21, 212103
Publication date2007-05-21
Affiliation Not a UNIGE publication
Research group
Citation (ISO format)
MOLINARI, Anna et al. Bias-dependent contact resistance in rubrene single-crystal field-effect transistors. In: Applied physics letters, 2007, vol. 90, n° 21, p. 212103. doi: 10.1063/1.2741411
Main files (1)
Article (Published version)
Identifiers
- PID : unige:156107
- DOI : 10.1063/1.2741411
Commercial URLhttp://aip.scitation.org/doi/10.1063/1.2741411
ISSN of the journal0003-6951
