Bias-dependent contact resistance in rubrene single-crystal field-effect transistors
Published inApplied physics letters, vol. 90, no. 21, 212103
Publication date2007-05-21
Affiliation entities Not a UNIGE publication
Research groups
Citation (ISO format)
MOLINARI, Anna et al. Bias-dependent contact resistance in rubrene single-crystal field-effect transistors. In: Applied physics letters, 2007, vol. 90, n° 21, p. 212103. doi: 10.1063/1.2741411
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Article (Published version)
Identifiers
- PID : unige:156107
- DOI : 10.1063/1.2741411
Commercial URLhttp://aip.scitation.org/doi/10.1063/1.2741411
Journal ISSN0003-6951