Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb3Sn wires
Published inScientific Reports, vol. 11, no. 7767
Publication date2021
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BAGNI, Tommaso et al. Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb3Sn wires. In: Scientific Reports, 2021, vol. 11, n° 7767. doi: 10.1038/s41598-021-87475-6
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- PID : unige:150869
- DOI : 10.1038/s41598-021-87475-6
Additional URL for this publicationhttp://www.nature.com/articles/s41598-021-87475-6
Journal ISSN2045-2322