Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb3Sn wires
Published inScientific Reports, vol. 11, no. 7767
Publication date2021
Abstract
Research group
Citation (ISO format)
BAGNI, Tommaso et al. Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb<sub>3</sub>Sn wires. In: Scientific Reports, 2021, vol. 11, n° 7767. doi: 10.1038/s41598-021-87475-6
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- PID : unige:150869
- DOI : 10.1038/s41598-021-87475-6
Commercial URLhttp://www.nature.com/articles/s41598-021-87475-6
ISSN of the journal2045-2322