Highly-sensitive reflectometry setup capable of probing the electrical double layer on silica
ContributorsPorus, Maria; Maroni, Plinio; Borkovec, Michal
Published inSensors and Actuators. B, Chemical, vol. 151, no. 1, p. 250-255
Publication date2010
Abstract
Keywords
- Reflectometry
- Double layer
- Lock-in detection
Affiliation entities
Citation (ISO format)
PORUS, Maria, MARONI, Plinio, BORKOVEC, Michal. Highly-sensitive reflectometry setup capable of probing the electrical double layer on silica. In: Sensors and Actuators. B, Chemical, 2010, vol. 151, n° 1, p. 250–255. doi: 10.1016/j.snb.2010.09.010
Main files (1)
Article (Published version)
Identifiers
- PID : unige:145033
- DOI : 10.1016/j.snb.2010.09.010
Additional URL for this publicationhttps://linkinghub.elsevier.com/retrieve/pii/S092540051000729X
Journal ISSN0925-4005