Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa2Cu3O7−δ Thin Films
ContributorsMatthey, Daniel; Reyren, Nicolas; Triscone, Jean-Marc; Schneider, T.
Published inPhysical Review Letters, vol. 98, no. 5/057002
Publication date2007
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MATTHEY, Daniel et al. Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa2Cu3O7−δ Thin Films. In: Physical Review Letters, 2007, vol. 98, n° 5/057002. doi: 10.1103/PhysRevLett.98.057002
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- PID : unige:125669
- DOI : 10.1103/PhysRevLett.98.057002
Additional URL for this publicationhttps://link.aps.org/doi/10.1103/PhysRevLett.98.057002
Journal ISSN0031-9007