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Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa2Cu3O7−δ Thin Films

Published inPhysical Review Letters, vol. 98, no. 5/057002
Publication date2007
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Citation (ISO format)
MATTHEY, Daniel et al. Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−δ</sub> Thin Films. In: Physical Review Letters, 2007, vol. 98, n° 5/057002. doi: 10.1103/PhysRevLett.98.057002
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ISSN of the journal0031-9007
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