Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa2Cu3O7−δ Thin Films

Matthey, Daniel; Reyren, Nicolas; Triscone, Jean-Marc; Schneider, T.

doi:10.1103/PhysRevLett.98.057002

Scientific article

English

Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa₂Cu₃O_7−δ Thin Films

ContributorsMatthey, Daniel; Reyren, Nicolas; Triscone, Jean-Marc; Schneider, T.

Published inPhysical Review Letters, vol. 98, no. 5/057002

Publication date2007

Affiliation entities

Faculté des sciences / Section de physique / Département de physique de la matière quantique

Research groups

Groupe Triscone

Citation (ISO format)

MATTHEY, Daniel et al. Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa₂Cu₃O_7−δ Thin Films. In: Physical Review Letters, 2007, vol. 98, n° 5/057002. doi: 10.1103/PhysRevLett.98.057002

Article (Published version)

Identifiers

PID : unige:125669
DOI : 10.1103/PhysRevLett.98.057002

Additional URL for this publicationhttps://link.aps.org/doi/10.1103/PhysRevLett.98.057002

Journal ISSN0031-9007

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Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa2Cu3O7−δ Thin Films

Technical informations

Electric-Field-Effect Modulation of the Transition Temperature, Mobile Carrier Density, and In-Plane Penetration Depth of NdBa₂Cu₃O_7−δ Thin Films