Si 2p Core-Level Shifts at the Si(001)-SiO2 Interface: a First-Principles Study
ContributorsPasquarello, Alfredo; Hybertsen, Mark S.; Car, Roberto
Published inPhysical Review Letters, vol. 74, no. 6, p. 1024-1027
Publication date1995
Abstract
Affiliation entities
Citation (ISO format)
PASQUARELLO, Alfredo, HYBERTSEN, Mark S., CAR, Roberto. Si 2p Core-Level Shifts at the Si(001)-SiO2 Interface: a First-Principles Study. In: Physical Review Letters, 1995, vol. 74, n° 6, p. 1024–1027. doi: 10.1103/PhysRevLett.74.1024
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Article (Published version)
Identifiers
- PID : unige:117886
- DOI : 10.1103/PhysRevLett.74.1024
Additional URL for this publicationhttps://link.aps.org/doi/10.1103/PhysRevLett.74.1024
Journal ISSN0031-9007
