OFDR measurements of insertion and return losses of integrated optic devices
ContributorsVon Der Weid, Jean-Pierre; Mussi, Giorgio; Troger, Jörg; Gisin, Nicolas
Presented at Liège, 25-26 September 1995
Publication date1995
Abstract
Affiliation
Citation (ISO format)
VON DER WEID, Jean-Pierre et al. OFDR measurements of insertion and return losses of integrated optic devices. In: 3rd Optical Fibre Measurement Conference: OFMC′95. Liège. [s.l.] : [s.n.], 1995.
Main files (1)
Proceedings chapter (Published version)
Identifiers
- PID : unige:114599