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English

OFDR measurements of insertion and return losses of integrated optic devices

Presented at Liège, 25-26 September 1995
Publication date1995
Abstract

The insertion loss of an integrated optic device is measured by means of the OFDR teclmique. Measurements of Rayleigh BackScattered intensity in the input and output fibers of the device allow direct detection of light power guided in the fiber before and after the component. The insertion and return losses of the component can thus be directly evaluated. Experimental results are in good agreement with measurements performed by the cut-back method.

Citation (ISO format)
VON DER WEID, Jean-Pierre et al. OFDR measurements of insertion and return losses of integrated optic devices. In: 3rd Optical Fibre Measurement Conference: OFMC′95. Liège. [s.l.] : [s.n.], 1995.
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