The problem of Sr doping and interface abruptness in La2−xSrxCuO4 multilayers: the application of transmission electron microscopy

Williams, Erica Jane; Cretton, Andréas; Jaccard, Y.; Locquet, J.-P.; Mächler, E.; Fischer, Oystein; Martinoli, P.; Schneider, T.

doi:10.1016/0921-4534(94)91592-X

Scientific article

English

The problem of Sr doping and interface abruptness in La_2−xSr_xCuO₄ multilayers: the application of transmission electron microscopy

ContributorsWilliams, Erica Jane; Cretton, Andréas; Jaccard, Y.; Locquet, J.-P.; Mächler, E.; Fischer, Oystein; Martinoli, P.; Schneider, T.

Published inPhysica C: Superconductivity and Its Applications, vol. 235-240, p. 735-736

Publication date1994

Abstract

This represents an attempt to use the local investigative properties of transmission electron microscopy to examine the content and distribution of strontium in La₂₋ₓSrₓCuO₄ thin films grown by molecular beam epitaxy on (001) strontium titanate substrates.

Affiliation entities

Faculté des sciences / Section de physique / Département de physique de la matière quantique

Citation (ISO format)

WILLIAMS, Erica Jane et al. The problem of Sr doping and interface abruptness in La_2−xSr_xCuO₄ multilayers: the application of transmission electron microscopy. In: Physica C: Superconductivity and Its Applications, 1994, vol. 235-240, p. 735–736. doi: 10.1016/0921-4534(94)91592-X

Article (Published version)

Identifiers

PID : unige:114576
DOI : 10.1016/0921-4534(94)91592-X

Additional URL for this publicationhttp://linkinghub.elsevier.com/retrieve/pii/092145349491592X

Journal ISSN0921-4534

454views

0downloads

Creation20/02/2019 09:19:00

First validation20/02/2019 09:19:00

Update15/03/2023 15:47:21

Status update15/03/2023 15:47:21

Last indexation31/10/2024 12:48:07

Archive ouverte UNIGE

The problem of Sr doping and interface abruptness in La2−xSrxCuO4 multilayers: the application of transmission electron microscopy

This represents an attempt to use the local investigative properties of transmission electron microscopy to examine the content and distribution of strontium in La₂₋ₓSrₓCuO₄ thin films grown by molecular beam epitaxy on (001) strontium titanate substrates.

Technical informations

The problem of Sr doping and interface abruptness in La_2−xSr_xCuO₄ multilayers: the application of transmission electron microscopy