Defect analysis using 2D-ACAR: GaAs as a test case
Contributeurs/tricesManuel, Alfred-Adrien; Ambigapathy, Rajesh; Saarinen, K.; Hautojärvi, P.; Corbel, C.
Publié dansApplied Surface Science, vol. 85, p. 301-304
Date de publication1995
Résumé
Structure d'affiliation
Citation (format ISO)
MANUEL, Alfred-Adrien et al. Defect analysis using 2D-ACAR: GaAs as a test case. In: Applied Surface Science, 1995, vol. 85, p. 301–304. doi: 10.1016/0169-4332(94)00348-3
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Article (Published version)
Identifiants
- PID : unige:114183
- DOI : 10.1016/0169-4332(94)00348-3
ISSN du journal0169-4332