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Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy

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Published in APL Materials. 2016, vol. 4, no. 8, p. 086105
Abstract We present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180∘ ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.
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Research group Groupe Triscone
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FERNANDEZ, Stéphanie et al. Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy. In: APL Materials, 2016, vol. 4, n° 8, p. 086105. https://archive-ouverte.unige.ch/unige:114138

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Deposited on : 2019-02-12

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