UNIGE document Chapitre d'actes
previous document  unige:112886  next document
add to browser collection
Title

Electronic nanofeatures in epitaxial ferroelectric oxide heterostructures

Authors
Tybell, Thomas
Char, K.
Beasley, M.R.
Beeli, C.
Stadelmann, P.
show hidden authors show all authors [1 - 9]
Published in Pavuna, Davor & Bozovic, Ivan. Superconducting and Related Oxides: Physics and Nanoengineering III. San Diego - 20-24 July 1998 - Bellingham: SPIE. 1998, p. 435-441
Collection SPIE proceedings series; 3481
Abstract We report on ferroelectric field effect experiments in epitaxial oxide heterostructures consisting of the ferroelectric oxide Pb(Zr,Ti)O₃ and the metallic oxides GdBa₂Cu₃O₇ and SrRuO₃. To perform the experiments, we used conventional capacitor structures, as well as a scanning probe approach that allows one to control the local ferroelectric polarization without the use of permanent electrical contacts. In the case of the scanning probe approach, nanometer scale control of the ferroelectric domain structure can be achieved over large areas of up to 2500 μm². Nonvolatile, reversible electronic nanofeatures were written in Pb(Zr₀.₅₂Ti₀.₄₈)O₃ / SrRuO₃ heterostructures by switching the local polarization field of the ferroelectric layer, inducing a field effect in the thin (30 Å) SrRuO₃ layer that changes its sheet resistance by 7%. This doping technique permits one to write reversible, nonvolatile electronic structures without requiring traditional lithographic processing or permanent electrical contacts.
Keywords Epitaxial oxide filmsFerroelectricsField effect
Identifiers
ISBN: 0819429368
Full text
Proceedings chapter (Published version) (603 Kb) - document accessible for UNIGE members only Limited access to UNIGE
Structures
Research group Groupe Triscone
Citation
(ISO format)
AHN, Charles et al. Electronic nanofeatures in epitaxial ferroelectric oxide heterostructures. In: Pavuna, Davor & Bozovic, Ivan (Ed.). Superconducting and Related Oxides: Physics and Nanoengineering III. San Diego. Bellingham : SPIE, 1998. p. 435-441. (SPIE proceedings series; 3481) doi: 10.1117/12.335881 https://archive-ouverte.unige.ch/unige:112886

286 hits

0 download

Update

Deposited on : 2019-01-15

Export document
Format :
Citation style :