Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading
ContributorsBarth, Christian; Seeber, Bernd; Rack, A.; Calzolaio, Ciro; Zhai, Y.; Matera, Davide; Senatore, Carmine
Published inScientific Reports, vol. 8, no. 6589
Publication date2018
Abstract
Affiliation entities
Research groups
Funding
- Swiss National Science Foundation - Applications of Superconductivity under Extreme Conditions [PP00P2_144673]
- Autre - Geneva/Princeton Collaborative Research Grants
Citation (ISO format)
BARTH, Christian et al. Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading. In: Scientific Reports, 2018, vol. 8, n° 6589. doi: 10.1038/s41598-018-24966-z
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Article (Published version)
Identifiers
- PID : unige:104010
- DOI : 10.1038/s41598-018-24966-z
Commercial URLhttp://www.nature.com/articles/s41598-018-24966-z
ISSN of the journal2045-2322