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A concise guide for the determination of less-studied technology-critical elements (Nb, Ta, Ga, In, Ge, Te) by inductively coupled plasma mass spectrometry in environmental samples

Authors
Rodushkin, Ilia
Published in Spectrochimica Acta. B, Atomic Spectroscopy. 2018, vol. 141, p. 80-84
Abstract There is an increasing demand for analytical techniques able to measure so-called ‘technology-critical elements’, a set of chemical elements increasingly used in technological applications, in environmental matrices. Nowadays, inductively coupled plasma-mass spectrometry (ICP-MS) has become the technique of choice for measuring trace element concentrations. However, its application is often less straightforward than often assumed. The hints and drawbacks of ICP-MS application to the measurement of a set of less-studied technology-critical elements (Nb, Ta, Ga, In, Ge and Te) is discussed here and concise guidelines given.
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Research group Limnology and Environmental Geology
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FILELLA, Montserrat, RODUSHKIN, Ilia. A concise guide for the determination of less-studied technology-critical elements (Nb, Ta, Ga, In, Ge, Te) by inductively coupled plasma mass spectrometry in environmental samples. In: Spectrochimica Acta. B, Atomic Spectroscopy, 2018, vol. 141, p. 80-84. https://archive-ouverte.unige.ch/unige:102307

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Deposited on : 2018-02-20

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