A low-temperature scanning tunneling microscope with in-situ sample cleaving

Article Article scientifique Article A low-temperature scanning tunneling microscope with in-situ sample cleaving eng 1992 author Kent A.D. author Renner Christoph 0000-0001-9882-681X 24186 author Niedermann Philipp 21882 author Bosch Jean-Gabriel 24415 author Fischer Oystein 25258 1632-1637 10.1016/0304-3991(92)90497-8 0304-3991 http://linkinghub.elsevier.com/retrieve/pii/0304399192904978 We present the design of a scanning tunneling microscope (STM) that is operated in an ultra-high vacuum (UHV) chamber at room temperature and can be lowered into a standard helium crystat and cooled with helium exchange gas to low temperatures. Central to the design of our system is a compact concentric tube scanning tunneling microscope in which the central tube serves as the scanner and the outer tube allows linear inertial translation of the sample by slip-stick motion. The fact that no mechanical connections are needed to approach the sample and tip allows great flexibility in the design of the system and the vibration isolation of the STM. Samples are cleaved in-situ in the UHV chamber. The stability of the instrument is demonstrated with images of both graphite and the high-temperature superconductor Bi₂Sr₂Ca₁Cu₂O₈ obtained in UHV (P = 2×10⁻¹⁰ Torr) at room temperature. Dewey 500.2 33 Département de physique de la matière quantique 131 false 783 Groupe Renner Ultramicroscopy 42-44 8bf010f6-7f05-40c9-89e6-1987133fb373 Article (Published version) Restricted Kent_Ultramicroscopy_1992421632.pdf 440714 application/pdf restrictedAccess Faculté des sciences / Section de physique / Département de physique de la matière quantique

Title	Published in	Access level	OA Policy	Year	Views	Downloads

A low-temperature scanning tunneling microscope with in-situ sample cleaving	Ultramicroscopy			1992	427	0

Archive ouverte UNIGE

Bosch, Jean-Gabriel