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Free accessOther version: http://aip.scitation.org/doi/10.1063/1.4993738
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Scientific Article
unige:95484 
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Note: Mechanical in situ exfoliation of van der Waals materials |
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| Authors | ||
| Published in | Review of Scientific Instruments. 2017, vol. 88, no. 7, p. 076104 | |
| Abstract | Exfoliation, namely, the peeling of layered materials down to a single unit-cell thin foil, opens promising avenues to fabricate novel electronic materials. New properties and original functionalities emerge in the single and few layer configurations of a number of layered compounds, in particular in transition metal dichalcogenides. However, many of these thin exfoliated materials are very sensitive to ambient conditions impeding the exploration of this new and fascinating parameter space. Here we describe a method of mechanical exfoliation in ultra-high vacuum (UHV). This technique is easily adaptable to any UHV system and allows preparing and studying air sensitive nanoflakes in situ. We present the basic design and proof-of-concept scanning tunneling microscopy imaging of VSe2 nanoflakes. | |
| Keywords | Exfoliation — Transition metal dichalcogenide — Scanning tunneling microscopy — Ultra high vacuum | |
| Identifiers | DOI: 10.1063/1.4993738 | |
| Full text |
Article (Published version) (7.2 MB) - Free access Other version: http://aip.scitation.org/doi/10.1063/1.4993738 |
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| Structures | ||
| Research group | Groupe Renner | |
| Project | FNS: 147607 | |
| Citation (ISO format) | PASZTOR, Arpad, SCARFATO, Alessandro, RENNER, Christoph. Note: Mechanical in situ exfoliation of van der Waals materials. In: Review of Scientific Instruments, 2017, vol. 88, n° 7, p. 076104. https://archive-ouverte.unige.ch/unige:95484 |
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